UV and EB nanoimprint lithography — the 3Dresyns NMF photoresist family
Segurola, Juan
This white paper covers UV and electron-beam nanoimprint lithography through the 3Dresyns NMF photoresist family, including stamp, resist and nano/micro fabrication routes.
NIL performance depends on resist viscosity, curing route, demoulding, pattern fidelity, shrinkage, adhesion and stamp compatibility. The NMF family is positioned as a nano/micro fabrication material system.
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Version DOI 10.5281/zenodo.22047972 · All versions in Zenodo